ABI Electronics Ltd
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SYSTEM 8 range - flexible and modular solutions


The SYSTEM 8 range is made up of modules that can be combined together to suit a variety of test applications and requirements. The range provides comprehensive fault-diagnosis capabilities, including in-circuit functional testing and discrete measurements, and is controlled by the SYSTEM 8 software. Modules can be installed in desktop PCs or combined together in an external case with USB interface.

 

 

 

Advanced Matrix Scanner (AMS)
The AMS module is a unique instrument capable of acquiring the V/I signature of components over a frequency range and under power off conditions. Signatures can be analysed or compared against a reference to detect leaky, damaged, inconsistent and incorrect components as well as short and open circuits. 64 channels + 4 single channels available per module with variable parameters (frequency, voltage, impedance, pulse outputs).


Test capabilities: V-I tests, V-I-F tests, Matrix V-I tests, V-T tests with pulse.

 

 

Advanced Test Module (ATM)
The ATM is a solution designed for the test and diagnostics of all digital ICs and PCBs from all logic families, including TTL, CMOS, LVTTL and ECL. The module offers power on and power off tests, either in or out of circuit. With high specifications and up to 2,048 channels, the module is ideal for both component and PCB testing.


Test capabilities: truth table tests with library (in/out of circuit), custom logic tests (all logic), PCB functional tests, connection tests, voltage tests, thermal tests, V/I tests, IC identification, short locator.

 

 

 
 

Board Fault Locator (BFL)
The BFL is aimed at testing TTL/CMOS digital ICs. With 64 test channels, it offers functional testing (in-circuit / out-of-circuit), connections and voltage tests as well as V/I analysis and thermal test. Up to 4 modules can be combined together to offer 256 test channels.


Test capabilities: truth table tests with library (in/out of circuit), custom TTL logic tests, connections tests, voltage tests, thermal tests, V/I tests, IC identification, short locator, EPROM verifier.

 

 

Analogue IC Tester (AICT)
The AICT allows in-circuit functional testing of analogue ICs and discrete components. All common analogue devices can be tested as they are configured on the PCB. The AICT also includes a fully configurable V/I tester equipped with a pulse generator to test gate-activated devices.


Test capabilities: functional tests, connections tests, voltage tests, signature analysis (VI),
matrix V/I tests (out-of-circuit optional), V/T tests with pulse.

 

 

 
 

Multiple Instrument Station 4 (MIS 4)
The MIS 4 provides 8 high specification test and measurement instruments in one compact module. Ideal for design, education or for general purpose workbench use, the MIS 4 saves you space and time offering a virtual digital storage oscilloscope, a virtual floating digital multimeter, a virtual arbitrary waveform generator, a virtual frequency and event counter, a programmable I/O, an integrated calculator with data logging, TestFlow manager for automated fault-finding sequences and customisable instruments. For optimised utilisation, standard instruments can be customised or new ones can be designed to suit applications.

 

 

Variable Power Supply (VPS)
The VPS provides the necessary supply voltages to the unit under test. The three outputs are variable in voltage and offer over voltage protection or current limitation.